Question

Atomic Force Microscopy monitors:

• A. Current between the surface and the probe
• B. Force between the surface and the probe
• C. Electromagnetic radiation between the surface and the probe
• D. distance between the surface and the probe

Hint:

The names of the two main scanning probe techniques tell you what they measure:

Scanning \textbf{Tunneling} Microscopy \(\rightarrow\) measures tunneling \textbf{current}.
Atomic \textbf{Force} Microscopy \(\rightarrow\) measures atomic \textbf{force}.

Answer 1

The Correct Option is B

Step 1: Concept Overview:
The question identifies the fundamental physical quantity measured by Atomic Force Microscopy (AFM) to create a surface image.
Step 2: In-depth Explanation:
The term "Atomic Force Microscopy" explains its principle. A micro-cantilever with a sharp tip approaches the sample surface.
Short-range interatomic forces (van der Waals, electrostatic, magnetic, etc.) between the tip and surface atoms cause the cantilever to bend.
The AFM measures this deflection using a laser beam reflected onto a photodetector. Deflection magnitude correlates to tip-sample force strength via Hooke's Law.
Scanning the tip across the surface and recording deflection (or height adjustments for constant deflection) maps surface topography. Thus, AFM directly measures the force between the probe and the surface.
Step 3: Conclusion:
Atomic Force Microscopy images are generated by measuring forces between a sharp probe and the sample's surface atoms.