X-rays are perfectly suited for crystal structure analysis due to their wavelengths (0.1–10 nm) corresponding to crystal lattice interplanar spacing. This characteristic facilitates constructive interference as X-rays interact with crystal atoms, in accordance with Bragg's law:
\(n\lambda = 2d \sin \theta\)
where:
$n$: Order of diffraction.
$\lambda$: Wavelength of X-rays.
$d$: Interplanar spacing.
$\theta$: Angle of incidence.
The resulting diffraction pattern is then examined to identify the crystal's atomic arrangement and symmetry.